Showing results: 16 - 30 of 473 items found.
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NX5300 -
Marvin Test Solutions, Inc.
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems. Advanced capabilities include simultaneous support of up to 255 devices on a single scan chain, support of sixteen NX5300 systems controlled by single host machine and configurable JTAG/BDM clock rates up to 24 MHz. The NX5300 includes 16 high-speed measurement channels. Each channel can measure logic levels, frequency, count events and perform a CRC check at rates up to 100 MHz.
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NX5300 -
Terotest Systems Ltd.
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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AME1553-1 -
AIM GmbH
MIL-STD-1553 Test and Simulation PCI Express Mini Card with 1 Dual Redundant channel plus 2 discrete Input, 2 discrete Output channels.
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AI-CCS-DATABAR -
Applied Image, Inc.
This test card is ideal for testing verifiers, scanners, and other GS1-DataBar barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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AI-CCS-128-E Rev B -
Applied Image, Inc.
This test card is ideal for testing of verifiers, scanners, and other GS1-128 barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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AI-CCS-UPC/EAN-E Rev S -
Applied Image, Inc.
For those who prefer a traditional vertical format calibration test card, APPLIED IMAGE offers our new Conformance Calibration Standard Enhanced for UPC/EAN Bar Code Symbol Verifiers. The new standard complies with both the ANSI X3.182 and ISO 15416 standards and is ideal for testing of verifiers, scanners, and other UPC bar reading equipment as well as a tool for training new operators to assure proper “methodology' in the use of verifiers.
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ASE1553M-x -
AIM GmbH
Single Function MIL-STD-1553 Test and Simulation module for PCIe with 1, 2 or 4 dual redundant streams.
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AI-CCS-ITF-14 -
Applied Image, Inc.
This test card is ideal for testing verifiers, scanners, and other ITF-14 (Interleaved 2 of 5) barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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AI-CCS-DM-G Rev A -
Applied Image, Inc.
This precision 2D barcode Conformance Calibration Standard Test Card is the first 2D test card to provide ALL 12 of the Primary Reference Symbols specified by ISO 15426-2 for barcode verifiers. They are sized from 0.5mm to 0.2mm so that all the symbol sizes specified in Annex A.3.1 can be tested. Symbols 1-4 are GS1 DataMatrix symbols, while symbols 5-12 are ISO/IEC Data Matrix symbols consistent with the ISO/IEC 16022 standard. The card also includes four calibrated reflectance patches.
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PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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GT9000P-USB3 -
Guide Technology, Inc.
A 2 channel Portable “CTIA” and/or “TIC” Test Platform controlled by USB3
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GT9000 -
Guide Technology, Inc.
GT9000 is a scalable 2 to 10 channelsBench-Top CTIA and/or TIC Test Platformwith 10” touch-screen-display (iPhone quality), integrated GUI with Touch, Ethernet, WiFi and/or wireless keyboard & mouse.
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GT9000R -
Guide Technology, Inc.
GT9000R is a scalable 2 to 24 channels 19”Rack-Mount CTIA and/or TIC Test Platformwith integrated GUI, Ethernet, Wi-Fi and/orwireless keyboard & mouse.